X-ray fluorescence analysis with a Johansson-type spectrometer

A new age is dawning in X-ray fluorescence spectrometry with the advent of 3(rd)-generation synchrotron radiation, especially undulator radiation in the X-ray region. Not only a brilliant source, but also a high-performance spectrometer is indispensable to realizing advanced analysis, which has been almost impossible so far. The present paper describes experimental feasibility tests of a Johansson-type spectrometer performed with monochromatic undulator radiation at SPring-8. A Ge (220) analyzing crystal (Rowland radius 350 mm) and a NaI:Tl detector with a 0.15 mm receiving slit were employed. The energy resolution obtained is 8eV for Cu K alpha(I) fine (8.04 keV), and is sufficient to separate signals from unnecessary scattering and other fluorescent X-rays. The resonant X-ray fluorescence spectra were obtained in a reasonably short time as well. Further optimization of detection efficiency is now under way for application to trace systems.