VERSATILE CURVED CRYSTAL SPECTROMETER FOR LABORATORY EXTENDED X-RAY ABSORPTION FINE-STRUCTURE MEASUREMENTS

被引：34

作者：

THULKE, W

HAENSEL, R

RABE, P

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1983年 / 54卷 / 03期

关键词：

D O I：

10.1063/1.1137383

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：277 / 283

页数：7

共 12 条

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