Pushing the limits of SPM

被引：6

作者：

Frenken, Joost W. M. ^{[1
]}

Oosterkamp, Tjerk H. ^{[1
]}

Hendriksen, Bas L. M. ^{[1
]}

Rost, Marcel J. ^{[1
,2
]}

机构：

[1] Leiden Univ, Kamerlingh Onnes Lab, NL-2300 RA Leiden, Netherlands

[2] Leiden Probe Microscopy BV, NL-2300 RA Leiden, Netherlands

来源：

MATERIALS TODAY | 2005年 / 8卷 / 05期

关键词：

D O I：

10.1016/S1369-7021(05)00842-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the two decades since the invention of the scanning tunneling microscope (STM) 1, the family of local probing techniques known as scanning probe microscopy (SPM) has come to full maturity. Nowadays, the quality with which nanoscale images can be obtained and local spectroscopic information acquired using these instruments is spectacular. In addition, the ease of use of these machines has improved so much that they have found their way into the laboratories, not just of physicists, but also chemists, biologists, and engineers.

引用

页码：20 / 25

页数：6

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