Broadband Microwave Frequency Characterization of 3-D Printed Materials

被引：122

作者：

Deffenbaugh, Paul I. ^{[1
]}

Rumpf, Raymond C. ^{[2
]}

Church, Kenneth H. ^{[3
,4
]}

机构：

[1] Univ Texas El Paso, WM Keck Ctr 3D, El Paso, TX 79902 USA

[2] Univ Texas El Paso, Keck Ctr, EMLab, El Paso, TX 79902 USA

[3] Univ Texas El Paso, Keck Ctr, El Paso, TX 79902 USA

[4] NScrypt, Orlando, FL 32826 USA

来源：

IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 2013年 / 3卷 / 12期

关键词：

3-D printing; direct-digital manufacturing; microwave materials measurement; printed electronics; COMPLEX DIELECTRIC-CONSTANT; AUTOMATIC-MEASUREMENT; STEREOLITHOGRAPHY; PERMEABILITY;

D O I：

10.1109/TCPMT.2013.2273306

中图分类号：

T [工业技术];

学科分类号：

120111 [工业工程];

摘要：

3-D printing allows increased design flexibility in the fabrication of microwave circuits and devices and is reaching a level of maturity that allows for functional parts. Little is known about the RF and microwave properties of the standard materials that have been developed for 3-D printing. This paper measures a wide variety of materials over a broad spectrum of frequencies from 1 MHz to 10 GHz using a variety of well-established measurement methods.

引用

页码：2147 / 2155

页数：9

共 30 条

[1]

Agilent Technologies, 2009, AG TECHN IMP MEAS HD

[2]

Agilent Technologies, 2011, AG E4991A RF IMP MAT

[3]

Agilent Technologies, 2000, AG 16453A DIEL MAT T

[4]

Agilent Technologies, 2008, AG 16451B DIEL TEST

[5]

Agilent Technologies, 2013, AG E4980A PREC LCR M

[6]

Agilent Technologies, 2001, ADV IMP MEAS CAP RF

[7]

[Anonymous], 2003, D15011 ASTM

[8]

Baker-Jarvis J., 2001, 1341 NIST EL EL ENG

[9]

Baker-Jarvis J, 2010, IEEE INSTRU MEAS MAG, V13, P24, DOI 10.1109/MIM.2010.5438334

[10]

AUTOMATIC MEASUREMENT OF COMPLEX DIELECTRIC-CONSTANT AND PERMEABILITY AT MICROWAVE-FREQUENCIES [J].

BLAKNEY, TL .

PROCEEDINGS OF THE IEEE, 1975, 63 (01) :203-205

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