Temperature and thickness driven spin-reorientation transition in amorphous Co-Fe-Ta-B thin films

被引：62

作者：

Sharma, P ^{[1
]}

Kimura, H

Inoue, A

Arenholz, E

Guo, JH

机构：

[1] Japan Sci & Technol Agcy, Sendai, Miyagi 9808577, Japan

[2] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan

[3] Univ Calif Berkeley, Adv Light Source, Berkeley, CA 94720 USA

来源：

PHYSICAL REVIEW B | 2006年 / 73卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.73.052401

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Magnetic properties of amorphous Co-Fe-Ta-B thin films are investigated. A tailorable spin reorientation transition (SRT) from in-plane single-domain-like state to out-of-plane multidomain state with increasing film thickness and temperature is obtained up to similar to 2.5 mu m thick films, in contrast to previously reported ultrathin ferromagnetic films of transition metals consisting of about half a dozen of monolayers. Atomic relaxation is shown to have significant influence on the SRT. Our results showed that the atomic randomness and the strains are responsible for the SRT in magnetic materials.

引用

页数：4

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