High resolution X-ray sensor for non destructive evaluation

Nondestructive evaluation (NDE) using X-rays is becoming indispensable for detecting microdefects in new materials currently used in aerospace and other engineering disciplines. Existing X-ray sensors pose limitations on the speed of operation due to persistence of the sensor and a problematic tradeoff between the sensor thickness and spatial resolution. To address these limitations we are developing a large area structured CsI(TI) imaging sensor for NDE using CCD based radiographic and computed tomographic systems. The sensor is formed by vapor deposition of CsI(TI) onto a specially designed fiberoptic substrate. Our work has produced X-ray sensors with a factor of 4.5 greater light output, at least three orders of magnitude faster decay time response, and greater spatial resolution (16% modulation transfer function, MTF(f), at 14 linepairs per millimeter (lp/mm)) compared to the currently used high density Tb2O3 doped fiberoptic glass scintillators. These performance advances will address the limitations of existing detector technology by producing high quality images and fast scan times required for real-time NDE inspection. Performance measurements for prototype CsI(TI) scintillator converters are presented. With these new sensors the development of larger area fiberoptic taper based CCD detectors with millisecond data acquisition capabilities and high spatial resolution suitable for NDE applications will be possible.