Band alignment in LaAlO3/SrTiO3 oxide heterostructures inferred from hard x-ray photoelectron spectroscopy

被引：48

作者：

Berner, G. ^{[1
,2
]}

Mueller, A. ^{[1
,2
]}

Pfaff, F. ^{[1
,2
]}

Walde, J. ^{[1
,2
]}

Richter, C. ^{[3
,4
]}

Mannhart, J. ^{[4
]}

Thiess, S.

Gloskovskii, A.

Drube, W. ^{[5
]}

Sing, M. ^{[1
,2
]}

Claessen, R. ^{[1
,2
]}

机构：

[1] Univ Wurzburg, Inst Phys, D-97074 Wurzburg, Germany

[2] Univ Wurzburg, Rontgen Ctr Complex Mat Syst RCCM, D-97074 Am Hubland, Wurzburg, Germany

[3] Univ Augsburg, Inst Phys, D-86135 Augsburg, Germany

[4] Max Planck Inst Solid State Res, D-70596 Stuttgart, Germany

[5] DESY Photon Sci, D-22603 Hamburg, Germany

来源：

PHYSICAL REVIEW B | 2013年 / 88卷 / 11期

关键词：

PRECISE DETERMINATION; ELECTRONIC-STRUCTURE; INTERFACES; SUPERCONDUCTIVITY; FERROMAGNETISM; COEXISTENCE; SRTIO3;

D O I：

10.1103/PhysRevB.88.115111

中图分类号：

T [工业技术];

学科分类号：

120111 [工业工程];

摘要：

We present a detailed study of the electronic structure and band alignment in LaAlO3/SrTiO3 oxide heterostructures by hard x-ray photoelectron spectroscopy. Our spectroscopic measurements find no evidence for the strong potential gradient within the polar LaAlO3 film predicted by band theory. Due to the high interface sensitivity of the method, we are further able to determine the valence band offset between the LaAlO3 film and the SrTiO3 substrate, which is found to be independent of the number of LAO overlayers. Finally, we discuss several explanations for the apparent absence of the built-in field in ex situ prepared LaAlO3/SrTiO3 heterostructures.

引用

页数：8

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