Photoacoustic thermal characterization of spark-processed porous silicon

被引:21
作者
CruzOrea, A
Delgadillo, I
Vargas, H
GudinoMartinez, A
Marin, E
VazquezLopez, C
Calderon, A
AlvaradoGil, JJ
机构
[1] UNIV AUTONOMA SLP,IICO,SAN LUIS POTOSI 78000,MEXICO
[2] UNIV LA HABANA,FAC FIS,VEDADO 10400,HABANA,CUBA
[3] INST POLITECN NACL,CINVESTAV,DEPT FIS,MEXICO CITY 07000,DF,MEXICO
关键词
D O I
10.1063/1.362626
中图分类号
O59 [应用物理学];
学科分类号
摘要
A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples, The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials. (C) 1996 American Institute of Physics.
引用
收藏
页码:8951 / 8954
页数:4
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