共 18 条
- [1] BHAT M, 1994, INTERNATIONAL ELECTRON DEVICES MEETING 1994 - IEDM TECHNICAL DIGEST, P329, DOI 10.1109/IEDM.1994.383401
- [3] Kamiyama S., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P827, DOI 10.1109/IEDM.1991.235297
- [4] Kamiyama S., 1993, International Electron Devices Meeting 1993. Technical Digest (Cat. No.93CH3361-3), P49, DOI 10.1109/IEDM.1993.347401
- [6] KOYANAGI M, 1978, IEDM, P348
- [8] Numasawa Y., 1989, International Electron Devices Meeting 1989. Technical Digest (Cat. No.89CH2637-7), P43, DOI 10.1109/IEDM.1989.74224
- [9] OKADA Y, 1994, S VLSI TECH, P105
- [10] Saitoh M., 1986, International Electron Devices Meeting 1986. Technical Digest (Cat. No.86CH2381-2), P680