Antireflection quarter-wave-thick, high-spatial-frequency, surface-relief gratings at oblique incidence

被引：1

作者：

Cojocaru, E

机构：

[1] Department of Lasers, Institute of Atomic Physics, R-76900, Bucharest-Magurele

来源：

APPLIED OPTICS | 1996年 / 35卷 / 31期

关键词：

D O I：

10.1364/AO.35.006231

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Zero-reflectance conditions for quarter-wave-thick, high-spatial-frequency, rectangular-groove dielectric gratings are analyzed further at oblique incidence by a combination of the effective medium theory and the anisotropic thin-film theory. Numerical examples are given for gratings on glass and silicon substrates with refractive indices of 1.5 and 3.5, respectively. (C) 1996 Optical Society of America

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页码：6231 / 6235

页数：5

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