A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

被引：81

作者：

Rychen, J ^{[1
]}

Ihn, T ^{[1
]}

Studerus, P ^{[1
]}

Herrmann, A ^{[1
]}

Ensslin, K ^{[1
]}

机构：

[1] ETH Honggerberg, Solid State Phys Lab, CH-8093 Zurich, Switzerland

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 06期

关键词：

D O I：

10.1063/1.1149842

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A scanning force microscope was implemented operating at temperatures below 4.2 K and in magnetic fields up to 8 T. Piezoelectric quartz tuning forks were employed for nonoptical tip-sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed. (C) 1999 American Institute of Physics. [S0034-6748(99)02206-6].

引用

页码：2765 / 2768

页数：4

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