Excess low-frequency flux noise in dc SQUIDs

被引：4

作者：

Huber, ME

Cromar, MW

Ono, RH

机构：

[1] SUPERCONDUCTING CORE TECHNOL,GOLDEN,CO 80401

[2] NATL INST STAND & TECHNOL,BOULDER,CO 80303

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1997年 / 7卷 / 02期

关键词：

D O I：

10.1109/77.621893

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have fabricated dc superconducting quantum interference devices (SQUIDs) incorporating Nb/Al-oxide/Nb Josephson junctions in both stripline and washer geometries. Low-frequency noise in excess of the predicted by the resistively-shunted junction model is present in both geometries and is demonstrated to be flux noise. This flux noise is no environmental. Improvements in fabrication processing over the past four years have reduced the level of this flux noise. SQUIDs are now fabricated with PdAu resistors, Nb wiring layers, and SiO2 interlayer dielectric. In our best well-coupled SQUIDs, the white-noise energy sensitivity is 5 x 10(31) J.s, with a 1/f knee below 0.1 Hz. We believe further reduction in the flux noise might be obtained with the use of on-chip flux shielding and/or trapping structures.

引用

页码：2882 / 2885

页数：4

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