DC scanning thermal microscopy: Characterisation and interpretation of the measurement

被引:46
作者
Gomes, S
Trannoy, N
Grossel, P
Depasse, F
Bainier, C
Charraut, D
机构
[1] Univ Reims, Lab Energet & Opt, Unite Therm & Anal Phys, F-51687 Reims 2, France
[2] UFR Sci & Tech, Inst Microtech Franche Comte, Lab Opt PM Duffieux, UMR 6603, F-25030 Besancon, France
关键词
scanning thermal microscopy; thermal probe; tip-sample interaction; thermal conductivity; thermal contact; thermal coupling;
D O I
10.1016/S1290-0729(01)01281-9
中图分类号
O414.1 [热力学];
学科分类号
摘要
The used Scanning Thermal Microscopy (SThM) probe is a thin Pt resistance wire acting as a heat source and as a detector simultaneously. Its energetic balance is investigated by the study of the temperature profile along the probe. A theoretical approach of the measurement, based on this investigation, is then proposed. Simulations with this modelling are shown to predict how the heat, electrically produced in the probe, is dissipated in the probe-sample system. In particular, it is shown that the steady-state of conduction losses to the thermal element support varies versus the thermal conductivity of the sample and can lead to bad interpretations of the measurement. (C) 2001 editions scientifiques et medicales Elsevier SAS.
引用
收藏
页码:949 / 958
页数:10
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