Electrical transport characteristics of Au/n-GaN Schottky diodes

被引:19
作者
Benamara, Z [1 ]
Akkal, B [1 ]
Talbi, A [1 ]
Gruzza, B [1 ]
机构
[1] Univ Clermont Ferrand, Lab Sci Mat Elect & Automat, F-63177 Aubiere, France
来源
MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS | 2006年 / 26卷 / 2-3期
关键词
GaN; electrical properties; Schottky barrier diode;
D O I
10.1016/j.msec.2005.10.016
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The current-voltage measurements were performed in the temperature range (80-300 K) on Au/ n-GaN Schottky barrier type diodes. The Schottky diode shows non-ideal I(V-G) behaviour with ideality factors n equals to 1.18 and 1.81 at 300 K and 80 K, respectively, and are thought to have a metal-interface layer-semiconductor configuration. Under forward bias and for T >= 200 K, the electrical current transport was controlled by the thermionic emission (TE) process. However, for T <= 200 K, The current was controlled by the thermionic field emission (TFE). The characteristic energy E-00 = 3.48 meV was obtained from the I(V-G, T) measurements and agreed very well with the value of E-00 = 3.62 meV calculated theoretically. The zero-bias barrier height phi(BO) determined from the I(VG) measurements was 0.84 eV at 300 K and decreases to 0.49 eV at 80 K. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:519 / 522
页数:4
相关论文
共 15 条
[1]   Modelization and characterization of Au/InSb/InP Schottky systems as a function of temperature [J].
Akkal, B ;
Benamara, Z ;
Boudissa, A ;
Bouiadjra, NB ;
Amrani, M ;
Bideux, L ;
Gruzza, B .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1998, 55 (03) :162-168
[2]   High temperature characteristics of AlGaN/GaN modulation doped field-effect transistors [J].
Aktas, O ;
Fan, ZF ;
Mohammad, SN ;
Botchkarev, AE ;
Morkoc, H .
APPLIED PHYSICS LETTERS, 1996, 69 (25) :3872-3874
[3]   STUDIES OF TUNNEL MOS DIODES .2. THERMAL EQUILIBRIUM CONSIDERATIONS [J].
CARD, HC ;
RHODERICK, EH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (10) :1602-+
[4]   NORMALIZED THERMIONIC-FIELD (T-F) EMISSION IN METAL-SEMICONDUCTOR (SCHOTTKY) BARRIERS [J].
CROWELL, CR ;
RIDEOUT, VL .
SOLID-STATE ELECTRONICS, 1969, 12 (02) :89-&
[5]   CURRENT-VOLTAGE CHARACTERISTIC OF TI-PSI METAL-OXIDE-SEMICONDUCTOR DIODES [J].
HANSELAER, PL ;
LAFLERE, WH ;
VANMEIRHAEGHE, RL ;
CARDON, F .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (08) :2309-2314
[6]   Electrical transport characteristics of Au/n-GaAs Schottky diodes on n-Ge at low temperatures [J].
Hudait, MK ;
Venkateswarlu, P ;
Krupanidhi, SB .
SOLID-STATE ELECTRONICS, 2001, 45 (01) :133-141
[7]   TEMPERATURE ACTIVATED CONDUCTANCE IN GAN/ALGAN HETEROSTRUCTURE FIELD-EFFECT TRANSISTORS OPERATING AT TEMPERATURES UP TO 300-DEGREES-C [J].
KHAN, MA ;
SHUR, MS ;
KUZNIA, JN ;
CHEN, Q ;
BURM, J ;
SCHAFF, W .
APPLIED PHYSICS LETTERS, 1995, 66 (09) :1083-1085
[8]   SCHOTTKY-BARRIER PHOTODETECTOR BASED ON MG-DOPED P-TYPE GAN FILMS [J].
KHAN, MA ;
KUZNIA, JN ;
OLSON, DT ;
BLASINGAME, M ;
BHATTARAI, AR .
APPLIED PHYSICS LETTERS, 1993, 63 (18) :2455-2456
[9]   OPTICAL ABSORPTION AND VACUUM-ULTRAVIOLET REFLECTANCE OF GAN THIN FILMS [J].
KOSICKI, BB ;
POWELL, RJ ;
BURGIEL, JC .
PHYSICAL REVIEW LETTERS, 1970, 24 (25) :1421-&
[10]  
NAKAMURA S, 1994, APPL PHYS LETT, V64, P28