Near-field spectroscopy of low-loss waveguide integrated microcavities -: art. no. 051112

被引：9

作者：

Cluzel, B

Picard, E

Charvolin, T

Hadji, E

Lalouät, L

de Fornel, F

Sauvan, C

Lalanne, P

机构：

[1] CEA, Dept Rech Fondamentale Mat Condensee, Lab Silicium Nanoelect Photon & Struct, F-38054 Grenoble, France

[2] Univ Bourgogne, CNRS, Phys Lab, F-21078 Dijon, France

[3] CNRS, Inst Opt, Lab Charles Fabry, F-91403 Orsay, France

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 05期

关键词：

D O I：

10.1063/1.2170141

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A scanning near-field spectroscopy method is used to observe loss reduction and Q-factor enhancement due to transverse-mode profile matching within photonic-crystal microcavities. Near-field measurements performed directly on cavity modes are compared with three-dimensional calculations and quantitative agreement is observed. (c) 2006 American Institute of Physics.

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页码：1 / 3

页数：3

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