TRANSMISSION ELECTRON MICROSCOPY STUDY OF PbTiO3 AND PbZrxTi1-xO3 FILMS

被引：2

作者：

De Veirman, A. E. M. ^{[1
]}

Staals, A. A. ^{[1
]}

Klee, M. ^{[2
]}

Larsen, P. K. ^{[1
]}

机构：

[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands

[2] Philips GmbH, Forschungslab, D-5100 Aachen, Germany

来源：

FERROELECTRICS | 1996年 / 184卷

关键词：

D O I：

10.1080/00150199608230244

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The microstructure of PbZr(x)Ti(1-x)O(3) films, as studied by means of transmission electron microscopy, is discussed in terms of grain size, morphology, domain configuration and second phase formation.

引用

页码：51 / 59

页数：9

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