Thin film microstructure control using glancing angle deposition by sputtering

被引:113
作者
Sit, JC [1 ]
Vick, D
Robbie, K
Brett, MJ
机构
[1] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6G 2G7, Canada
[2] Alberta Microelect Corp, Edmonton, AB T6G 2T9, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1557/JMR.1999.0162
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films with microstructures controlled on a nanometer scale have been fabricated using a recently developed process called glancing angle deposition (GLAD) which combines oblique angle evaporation with controlled substrate motion. Critical to the production of GLAD thin films is the requirement for a narrow angular flux distribution centered at an oblique incidence angle. We report here recent work with low-pressure, long-throw sputter deposition with which we have succeeded in fabricating porous titanium thin films possessing "zig-zag," helical, and "pillar" microstructures, demonstrating microstructural control on a level consistent with evaporated GLAD. The use of sputtering for GLAD simplifies process control and should enable deposition of a broader range of thin film materials.
引用
收藏
页码:1197 / 1199
页数:3
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