Mapping the elemental distribution in sol-gel derived ceramics

Elemental dispersive X-ray (EDX) composition distribution mapping using a scanning electronmicroscope (SEM) provides information about samples that is complementary to that obtained from X-ray diffraction. Examples are given (e.g., Ba and Cu maps of YBa2CU3O7-delta see figure) to demonstrate the usefulness of this technique in evaluating the homogeneity of sol-gel products and in elucidating elemental zoning (see also cover picture).