Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold

被引：16

作者：

Planès, J

Samson, Y

Cheguettine, Y

机构：

[1] Univ Grenoble 1, CEA Grenoble, Dept Rech Fondamentale Mat Condensee, Lab Phys Met Synthet,CNRS,UMR 5819, F-38054 Grenoble 9, France

[2] CEA Grenoble, Lab Nanostruct & Magnetisme, F-38054 Grenoble, France

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 10期

关键词：

D O I：

10.1063/1.124705

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Tapping-mode atomic force microscopy is used to image the conducting network of polyaniline inside organic blends. The greater stiffness of the conducting polymer phase with respect to the matrix leads to good resolution phase contrast imaging. Cross-section images provide a unique insight in the distribution of the conductive phase within the matrix. (C) 1999 American Institute of Physics. [S0003-6951(99)04336-3].

引用

页码：1395 / 1397

页数：3

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