Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements

被引:88
作者
Chen, X
Davies, MC [1 ]
Roberts, CJ
Tendler, SJB
Williams, PM
Davies, J
Dawkes, AC
Edwards, JC
机构
[1] Univ Nottingham, Sch Pharmaceut Sci, Lab Biophys & Surface Anal, Nottingham NG7 2RD, England
[2] Ortho Clin Diagnost, Pollards Wood Labs, Chalfont St Giles HP8 4SP, Bucks, England
基金
英国生物技术与生命科学研究理事会;
关键词
imaging; methods and techniques; scanning probe microscopy;
D O I
10.1016/S0304-3991(98)00068-0
中图分类号
TH742 [显微镜];
学科分类号
摘要
Vibrating mode force measurements, or amplitude-phase-distance measurements, have been used to experimentally investigate contrast mechanisms in tapping mode atomic force microscopy. Gelatin adsorbed on polystyrene and mica surfaces have been taken as examples to show that the amplitude-phase-distance curves and amplitude-energy loss-distance curves enable the interpretation of artifacts in height images and contrast in phase images. The principles are applicable in general to tapping mode imaging, and are discussed in the context of previously proposed theoretical models, i.e., those based on solution of equations of motion or on energy conservation. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:171 / 181
页数:11
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