Materials' properties measurements: Choosing the optimal scanning probe microscope configuration

被引:95
作者
Burnham, NA
Gremaud, G
Kulik, AJ
Gallo, PJ
Oulevey, F
机构
[1] Ecl. Polytech. Federale de Lausanne, Département de Physique
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 02期
关键词
D O I
10.1116/1.589086
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Rheological models are used to represent different scanning probe microscope configurations. The solutions for their static and dynamic behavior are found and used to analyze which scanning probe microscope configuration is best for a given application. We find that modulating the sample at high frequencies results in the best microscope behavior for measuring the stiffness of rigid materials, and that by modulating the tip at low frequencies and detecting the motion of the tip itself (not its position relative to the tip holder) should be best for studying compliant materials in liquids. (C) 1996 American Vacuum Society.
引用
收藏
页码:1308 / 1312
页数:5
相关论文
共 12 条
  • [1] Interpretation of force curves in force microscopy
    Burnham, N.A.
    Colton, R.J.
    Pollock, H.M.
    [J]. 1600, (04):
  • [2] Scanning local-acceleration microscopy
    Burnham, NA
    Kulik, AJ
    Gremaud, G
    Gallo, PJ
    Oulevey, F
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 794 - 799
  • [3] MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE
    BURNHAM, NA
    COLTON, RJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2906 - 2913
  • [4] BURNHAM NA, 1995, PROCEDURES SCANNING
  • [5] DRAPER CF, IN PRESS J MATER RES
  • [6] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY
    DURIG, U
    GIMZEWSKI, JK
    POHL, DW
    [J]. PHYSICAL REVIEW LETTERS, 1986, 57 (19) : 2403 - 2406
  • [7] ATOMIC-FORCE MICROSCOPE WITH MAGNETIC FORCE MODULATION
    FLORIN, EL
    RADMACHER, M
    FLECK, B
    GAUB, HE
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (03) : 639 - 643
  • [8] GREMAUD G, 1987, J PHYS C SOLID STATE, V8, P15
  • [9] HEUBERGER M, 1994, NANOTECHNOLOGY, V5, P12
  • [10] Jarvis SP, 1995, NATO ADV SCI INST SE, V286, P105