Scanning local-acceleration microscopy

被引：125

作者：

Burnham, NA

Kulik, AJ

Gremaud, G

Gallo, PJ

Oulevey, F

机构：

[1] Département de Physique, Ecl. Polytech. Federale de Lausanne

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 02期

关键词：

D O I：

10.1116/1.588715

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

By adapting a scanning force microscope to operate at frequencies above the highest tip-sample resonance, the sensitivity of the microscope to materials' properties is greatly enhanced. The cantilever's behavior in response to high-frequency excitation from a transducer underneath the sample is fundamentally different than to its low-frequency response. in this article, the motivations, instrumentation, theory, and first results for this technique are described. (C) 1996 American Vacuum Society.

引用

页码：794 / 799

页数：6

共 20 条

[1]

[Anonymous], 1991, METAL MATRIX COMPOSI

[2]

Interpretation of force curves in force microscopy [J].