Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy -: art. no. 193411

被引:177
作者
San Paulo, A [1 ]
García, R [1 ]
机构
[1] CSIC, Inst Microelect Madrid, Madrid 28760, Spain
来源
PHYSICAL REVIEW B | 2001年 / 64卷 / 19期
关键词
D O I
10.1103/PhysRevB.64.193411
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Amplitude-modulation (tapping mode) atomic force microscopy is a technique for high resolution imaging of a wide variety of surfaces in air and liquid environments. Here by using the virial theorem and energy conservation principles we have derived analytical relationships between the oscillation amplitude, phase shift, and average tip-surface forces. We find that the average value of the interaction force and oscillation and the average power dissipated by the tip-surface interaction are the quantities that control the amplitude reduction. The agreement obtained between analytical and numerical results supports the analytical method.
引用
收藏
页数:4
相关论文
共 26 条
[1]   Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects [J].
Anczykowski, B ;
Kruger, D ;
Fuchs, H .
PHYSICAL REVIEW B, 1996, 53 (23) :15485-15488
[2]   Characterization of the morphologies and nanostructures of blends of poly(styrene) block-poly(ethene-co-but-1-ene)-block-poly(styrene) with isotactic and atactic polypropylenes by tapping-mode atomic force microscopy [J].
Bar, G ;
Thomann, Y ;
Whangbo, MH .
LANGMUIR, 1998, 14 (05) :1219-1226
[3]   NUMERICAL SIMULATIONS OF A SCANNING FORCE MICROSCOPE WITH A LARGE-AMPLITUDE VIBRATING CANTILEVER [J].
CHEN, J ;
WORKMAN, RK ;
SARID, D ;
HOPER, R .
NANOTECHNOLOGY, 1994, 5 (04) :199-204
[4]   Optimizing phase imaging via dynamic force curves [J].
Chen, X ;
Davies, MC ;
Roberts, CJ ;
Tendler, SJB ;
Williams, PM ;
Burnham, NA .
SURFACE SCIENCE, 2000, 460 (1-3) :292-300
[5]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[6]   Tip-sample interaction in tapping-mode scanning force microscopy [J].
de Pablo, PJ ;
Colchero, J ;
Luna, M ;
Gómez-Herrero, J ;
Baró, AM .
PHYSICAL REVIEW B, 2000, 61 (20) :14179-14183
[7]   EFFECT OF CONTACT DEFORMATIONS ON ADHESION OF PARTICLES [J].
DERJAGUIN, BV ;
MULLER, VM ;
TOPOROV, YP .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1975, 53 (02) :314-326
[8]   Dynamics of a vibrating tip near or in intermittent contact with a surface [J].
García, R ;
San Paulo, A .
PHYSICAL REVIEW B, 2000, 61 (20) :13381-13384
[9]   Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy [J].
García, R ;
San Paulo, A .
PHYSICAL REVIEW B, 1999, 60 (07) :4961-4967
[10]   Amplitude curves and operating regimes in dynamic atomic force microscopy [J].
García, R ;
San Paulo, A .
ULTRAMICROSCOPY, 2000, 82 (1-4) :79-83