Tip-sample interaction in tapping-mode scanning force microscopy

被引：50

作者：

de Pablo, PJ ^{[1
]}

Colchero, J ^{[1
]}

Luna, M ^{[1
]}

Gómez-Herrero, J ^{[1
]}

Baró, AM ^{[1
]}

机构：

[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 20期

关键词：

D O I：

10.1103/PhysRevB.61.14179

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Tip-sample interaction in intermittent contact scanning force microscopy, also called tapping mode, is experimentally studied to determine under which conditions tip-sample contact is established. Force vs distance curves are made while the cantilever is oscillating at its resonance frequency. Cantilevers with different force constants driven at different oscillation amplitudes have been used. In addition, samples with different hardness, such as silicon oxide, glass, and highly orientated pyrolytic graphite were taken as sample surface. From the analysis of the data we conclude that by choosing appropriate operating conditions, tip-sample contact can be avoided. This operating regime is of general interest in scanning force microscopy, since it allows imaging of even the softest samples.

引用

页码：14179 / 14183

页数：5

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