Muonium states and dynamics as a model for hydrogen in semiconductors

被引:18
作者
Cox, SFJ
Lichti, RL
机构
[1] UCL, LONDON WC1E 6BT, ENGLAND
[2] TEXAS TECH UNIV, LUBBOCK, TX 79409 USA
关键词
hydrogen; semiconductors; passivation; muonium; diffusion;
D O I
10.1016/S0925-8388(96)02974-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An atomistic picture of interstitial hydrogen in semiconductors involves, as it does for hydrogen in metals, determination of the lattice sites and configurations adopted and the mechanisms of diffusion. An additional dimension is added in semiconductors, namely the possibility of examining different charge states of the defect centre--positive, neutral and negative-respectively the diamagnetic proton, the paramagnetic hydrogen atom and diamagnetic hydride ion. Muon spectroscopy has been successful in modelling all these states, determining their local structure, their different stabilities, mobilities and interactions with charge carriers. In semiconductors doped heavily to metallic conductivities, only diamagnetic states are observed, though still with a rich variety of mobilities and trapping sites. Studies of the interaction and pairing with dopant atoms, simulating the important process of passivation, also appear promising. This short review is illustrated with recent results for the elemental semiconductors Si and Ge and the compounds GaAs and InP.
引用
收藏
页码:414 / 419
页数:6
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