EXAMINER CHARACTERISTICS AND PATENT OFFICE OUTCOMES

被引:148
作者
Lemley, Mark A. [1 ]
Sampat, Bhaven [2 ]
机构
[1] Stanford Law Sch, Stanford, CA USA
[2] Columbia Univ, New York, NY 10027 USA
关键词
D O I
10.1162/REST_a_00194
中图分类号
F [经济];
学科分类号
02 ;
摘要
In this paper, we show that there are important differences across patent examiners at the U.S. Patent and Trademark Office. We show that more experienced examiners cite less prior art, are more likely to grant patents, and are more likely to grant patents without any rejections. These results suggest that the most important decisions made by the patent office are significantly affected by the happenstance of which examiner gets an application. They also point to human resource policies as potentially important levers, hitherto neglected, in patent system reform.
引用
收藏
页码:817 / 827
页数:11
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