On the stability of organic field-effect transistor materials

被引:16
作者
Schön, JH [1 ]
机构
[1] Lucent Technol, Bell Labs, Murray Hill, NJ 07974 USA
关键词
D O I
10.1063/1.1421230
中图分类号
O59 [应用物理学];
学科分类号
摘要
Stability and degradation of transistor performance of devices based on pentacene and alpha -sexithiophene are investigated. In order to distinguish between effects at grain boundaries and material issues, macroscopic bicrystals were used, where transistors were prepared on a single grain as well as across a single grain boundary. The main reason for performance instabilities is the formation of oxygen-related trapping states at the grain boundary upon exposure to air. However, especially in the case of pentacene, stable hole transport properties are observed. (C) 2001 American Institute of Physics.
引用
收藏
页码:4163 / 4164
页数:2
相关论文
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