Hysteresis in YHx films observed with in situ measurements -: art. no. 054110

被引:23
作者
Remhof, A
Kerssemakers, JWJ
van der Molen, SJ
Griessen, R
Kooij, ES
机构
[1] Vrije Univ Amsterdam, Fac Sci, Div Phys & Astron, NL-1081 HV Amsterdam, Netherlands
[2] Univ Twente, Fac Appl Phys, Mesa Res Inst, NL-7500 AE Enschede, Netherlands
关键词
D O I
10.1103/PhysRevB.65.054110
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Giant hysteretic effects in the YHx hydrogen switchable mirror system are observed between x = 1.9 and x = 3 in pressure composition isotherms, optical and electrical properties, and mechanical stress. Polycrystalline Y films are studied by simultaneous in situ measurements of electrical resistivity, optical transmittance and x-ray diffractometry. These experiments are linked to optical microscopy of the samples. During hydrogen loading above x = 1.9 the films stay in the metallic fee phase until the optical transmittance reaches its minimum and the electrical resistance curve exhibits a characteristic feature at = 2.1. Upon further loading the system crosses the miscibility gap in which the fee phase coexists with the hcp phase before hydrogen saturation is reached in the pure hcp phase. While the fee phase stays at a concentration of x = 2.1 in the coexistence region during loading, it remains at a concentration of x = 1.9 during unloading. The hysteretic effects observed in optical transmission and electrical resistivity result from the different properties of the low concentration fee phase YH1.9 and the high concentration fcc phase YH2.1. They can be explained on the basis of the bulk phase diagram if the different stress states during loading and unloading are taken into account. These results contradict earlier interpretations of the hysteresis in thin film YHx, based on nonsimultaneous measurements of the optical and structural properties on different films.
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页码:1 / 8
页数:8
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