An elastically bent silicon monochromator for a neutron diffractometer

被引：21

作者：

Tanaka, I ^{[1
]}

Niimura, N

Mikula, P

机构：

[1] JAERI, Adv Sci Res Ctr, Tokai, Ibaraki 3191195, Japan

[2] Acad Sci Czech Republ, Inst Nucl Phys, CZ-25068 Rez, Czech Republic

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1999年 / 32卷

关键词：

D O I：

10.1107/S0021889899003192

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new type of elastically bent perfect Si (EBP-Si) monochromator for a neutron diffractometer dedicated to protein crystallography has been developed and successfully applied to two such diffractometers. It was experimentally demonstrated that the monochromatic neutron intensity increased and the beam was focused at the sample position when the monochromator was suitably bent. A specially designed bender for the EBP-Si monochromator, already applied to several diffractometers, is described. The distinctive features of the EBP-Si monochromator are summarized.

引用

页码：525 / 529

页数：5