Influence of metal roughness on the near-field generated by an aperture/apertureless probe

被引：42

作者：

Martin, OJF ^{[1
]}

Paulus, M

机构：

[1] ETH Zurich, ETH Zentrum, Swiss Fed Inst Technol, Electromagnet Fields & Microwave Elect Lab, CH-8092 Zurich, Switzerland

[2] IBM Corp, Zurich Res Lab, Res, CH-8803 Ruschlikon, Switzerland

来源：

JOURNAL OF MICROSCOPY-OXFORD | 2002年 / 205卷 / 205期

关键词：

aperture probe; apertureless probe; contrast mechanisms; image formation; local probe microscopy; near-field optics; numerical simulations; scattering probe; surface roughness;

D O I：

10.1046/j.0022-2720.2001.00979.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We study the influence of metal roughness on the near-field distribution generated by an aperture or an apertureless (scattering) probe. Different experimental parameters are investigated: roughness magnitude, aperture form, distribution of the roughness. Our results show that aluminium roughness has a dramatic impact on the emission characteristics of a near-field probe and in particular on its polarization sensitivity. Apertureless or scattering probes appear to be less sensitive to roughness and to provide a well confined field even with a somewhat rough probe.

引用

页码：147 / 152

页数：6

共 21 条

[1] NEAR-FIELD OPTICAL MICROSCOPE BASED ON LOCAL PERTURBATION OF A DIFFRACTION SPOT [J].

BACHELOT, R ;

GLEYZES, P ;

BOCCARA, AC .

OPTICS LETTERS, 1995, 20 (18) :1924-1926

[2] Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers [J].

Held, T ;

Emonin, S ;

Marti, O ;

Hollricher, O .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08) :3118-3122

[3] NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A METALLIC PROBE TIP [J].

INOUYE, Y ;

KAWATA, S .

OPTICS LETTERS, 1994, 19 (03) :159-161

[4]

Jackson J. D., 1999, CLASSICAL ELECTRODYN, V3rd

[5] Contrast enhancement using polarization-modulation scanning near-field optical microscopy (PM-SNOM) [J].

Lacoste, T ;

Huser, T ;

Prioli, R ;

Heinzelmann, H .

ULTRAMICROSCOPY, 1998, 71 (1-4) :333-340

[6] Chemically etched fiber tips for near-field optical microscopy: a process for smoother tips [J].

Lambelet, P ;

Sayah, A ;

Pfeffer, M ;

Philipona, C ;

Marquis-Weible, F .

APPLIED OPTICS, 1998, 37 (31) :7289-7292

[7] Dielectric versus topographic contrast in near-field microscopy [J].

Martin, OJF ;

Girard, C ;

Dereux, A .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (09) :1801-1808

[8] Electromagnetic scattering in polarizable backgrounds [J].

Martin, OJF ;

Piller, NB .

PHYSICAL REVIEW E, 1998, 58 (03) :3909-3915

[9]

Martin OJF, 1999, J MICROSC-OXFORD, V194, P235, DOI 10.1046/j.1365-2818.1999.00560.x

[10] Partial reconstitution of a replication-competent retrovirus in helper cells with partial overlaps between vector and helper cell genomes [J].

Martinez, I ;

Dornburg, R .

HUMAN GENE THERAPY, 1996, 7 (06) :705-712

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