共 27 条
[2]
PSTM - AN ALTERNATIVE TO MEASURE LOCAL VARIATION OF OPTICAL INDEX
[J].
MICROSCOPY MICROANALYSIS MICROSTRUCTURES,
1994, 5 (4-6)
:435-446
[3]
Born M., 1986, PRINCIPLES OPTICS
[4]
ANALYSIS OF PHOTON-SCANNING TUNNELING MICROSCOPE IMAGES OF INHOMOGENEOUS SAMPLES - DETERMINATION OF THE LOCAL REFRACTIVE-INDEX OF CHANNEL WAVE-GUIDES
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION,
1995, 12 (01)
:95-106
[5]
INFLUENCE OF DIELECTRIC CONTRAST AND TOPOGRAPHY ON THE NEAR-FIELD SCATTERED BY AN INHOMOGENEOUS SURFACE
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION,
1995, 12 (12)
:2716-2725
[8]
IMAGING OF SUBMICRON INDEX VARIATIONS BY SCANNING OPTICAL TUNNELING
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1992, 10 (06)
:2436-2439
[9]
MODELING OF THE FIELD TRANSFER THROUGH THICK DIELECTRIC LINES - USE IN LINEWIDTH MEASUREMENT
[J].
APPLIED OPTICS,
1991, 30 (11)
:1355-1360