Scanning Ion Conductance Microscopy

被引：170

作者：

Chen, Chiao-Chen ^{[1
]}

Zhou, Yi ^{[1
]}

Baker, Lane A. ^{[1
]}

机构：

[1] Indiana Univ, Dept Chem, Bloomington, IN 47405 USA

来源：

ANNUAL REVIEW OF ANALYTICAL CHEMISTRY, VOL 5 | 2012年 / 5卷

关键词：

nanopipette; SICM; scanning probe microscopy; microscopy; bioanalytical; PATCH-CLAMP; ELECTROCHEMICAL MICROSCOPY; CONTROLLED DEPOSITION; OPTICAL MICROSCOPY; LIVING CELLS; SURFACE; MEMBRANES; CHANNELS; TRANSPORT; DELIVERY;

D O I：

10.1146/annurev-anchem-062011-143203

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Scanning ion conductance microscopy (SICM) is a versatile type of scanning probe microscopy for studies in molecular biology and materials science. Recent advances in feedback and probe fabrication have greatly increased the resolution, stability, and speed of imaging. Noncontact imaging and the ability to deliver materials to localized areas have made SICM especially fruitful for studies of molecular biology, and many examples of such use have been reported. In this review, we highlight new developments in the operation of SICM and describe some of the most exciting recent studies from this growing field.

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收藏

页码：207 / 228

页数：22

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