A slow positron beam study of natural and synthetic diamonds

被引：7

作者：

Fischer, CG

Connell, SH

Coleman, PG

Malik, F

Britton, DT

Sellschop, JPF

机构：

[1] Univ Witwatersrand, Schonland Res Ctr Nucl Sci, ZA-2050 Wits, South Africa

[2] Univ E Anglia, Sch Phys, Norwich NR4 7TJ, Norfolk, England

[3] Univ Cape Town, Dept Phys, ZA-7700 Rondebosch, South Africa

来源：

APPLIED SURFACE SCIENCE | 1999年 / 149卷 / 1-4期

关键词：

diamond; positron annihilation; diffusion length;

D O I：

10.1016/S0169-4332(99)00205-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have depth profiled single crystalline natural type IIA, type IIB and synthetic type IB diamonds with a slow positron beam using Doppler broadening spectroscopy. It was found that the data for all three samples, which differ with respect to defect type and content, could be well described using only a surface and a homogenous bulk component. The bulk positron diffusion lengths measured for these samples were found to be sensitive to the differing defect composition of the samples. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：221 / 226

页数：6

共 19 条

[1] THEORY OF IMPURITIES IN DIAMOND [J].