Transfer function and near-field detection of evanescent waves

被引:14
作者
Radko, Ilya P.
Bozhevolnyi, Sergey I.
Gregersen, Niels
机构
[1] Aalborg Univ, Dept Phys & Nanotechnol, DK-9220 Aalborg, Denmark
[2] Tech Univ Denmark, Dept Commun Opt & Mat, DK-2800 Lyngby, Denmark
关键词
D O I
10.1364/AO.45.004054
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We consider characterization of a near-field optical probe in terms of detection efficiency of different spatial frequencies associated with propagating and evanescent field components. The former are both detected with and radiated from an etched single-mode fiber tip, showing reciprocity of collection and illumination modes. Making use of a collection near-field microscope with a similar fiber tip illuminated by an evanescent field, we measure the collected power as a function of the field spatial frequency in different polarization configurations. Considering a two-dimensional probe configuration, numerical simulations of detection efficiency based on the eigenmode expansion technique are carried out for different tip apex angles. The detection roll-off for high spatial frequencies observed in the experiment and obtained during the simulations is fitted using a simple expression for the transfer function, which is derived by introducing an effective point of (dipolelike) detection inside the probe tip. It is found to be possible to fit reasonably well both the experimental and the simulation data for evanescent field components, implying that the developed approximation of the near-field transfer function can serve as a simple, rational, and sufficiently reliable means of fiber probe characterization. (c) 2006 Optical Society of America.
引用
收藏
页码:4054 / 4061
页数:8
相关论文
共 23 条
[1]   Optical modelling of photonic crystals and VCSELs using eigenmode expansion and perfectly matched layers [J].
Bienstman, P ;
Baets, R .
OPTICAL AND QUANTUM ELECTRONICS, 2001, 33 (4-5) :327-341
[2]   Near-field optical imaging of light propagation in semiconductor waveguide structures [J].
Bourzeix, S ;
Moison, JM ;
Mignard, F ;
Barthe, F ;
Boccara, AC ;
Licoppe, C ;
Mersali, B ;
Allovon, M ;
Bruno, A .
APPLIED PHYSICS LETTERS, 1998, 73 (08) :1035-1037
[3]   Localization phenomena in elastic surface-polariton scattering caused by surface roughness [J].
Bozhevolnyi, SI .
PHYSICAL REVIEW B, 1996, 54 (11) :8177-8185
[4]   Direct observation of localized dipolar excitations on rough nanostructured surfaces [J].
Bozhevolnyi, SI ;
Markel, VA ;
Coello, V ;
Kim, W ;
Shalaev, VM .
PHYSICAL REVIEW B, 1998, 58 (17) :11441-11448
[5]   Elastic scattering of surface plasmon polaritons: Modeling and experiment [J].
Bozhevolnyi, SI ;
Coello, V .
PHYSICAL REVIEW B, 1998, 58 (16) :10899-10910
[6]   Self-consistent model for photon scanning tunneling microscopy: Implications for image formation and light scattering near a phase-conjugating mirror [J].
Bozhevolnyi, SI ;
Vohnsen, B ;
Bozhevolnaya, EA ;
Berntsen, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (12) :2381-2392
[7]   Transfer functions in collection scanning near-field optical microscopy [J].
Bozhevolnyi, SI ;
Vohnsen, B ;
Bozhevolnaya, EA .
OPTICS COMMUNICATIONS, 1999, 172 (1-6) :171-179
[8]   2-DIMENSIONAL NUMERICAL-SIMULATION OF THE PHOTON SCANNING TUNNELING MICROSCOPE - CONCEPT OF TRANSFER-FUNCTION [J].
CARMINATI, R ;
GREFFET, JJ .
OPTICS COMMUNICATIONS, 1995, 116 (4-6) :316-321
[9]   NEAR-FIELD MEASUREMENTS OF OPTICAL CHANNEL WAVE-GUIDES AND DIRECTIONAL-COUPLERS [J].
CHOO, AG ;
JACKSON, HE ;
THIEL, U ;
DEBRABANDER, GN ;
BOYD, JT .
APPLIED PHYSICS LETTERS, 1994, 65 (08) :947-949
[10]  
Goodman J.W., 1996, Opt. Eng, V35, P1513, DOI DOI 10.1016/J.APSUSC.2017.08.033