Thermal noise and radiation pressure in MEMS Fabry-Perot tunable filters and lasers

被引:41
作者
Tucker, RS [1 ]
Baney, DM [1 ]
Sorin, WV [1 ]
Flory, CA [1 ]
机构
[1] Agilent Labs, Agilent Technol, Palo Alto, CA 94304 USA
关键词
Fabry-Perot etalons; MEMS; radiation pressure; thermal noise; tunable optical filters; tunable lasers;
D O I
10.1109/2944.991403
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we examine thermal noise and radiation-pressure effects in MEMS tunable Fabry-Perot etalons. We show that thermal noise causes a jitter in the center wavelength in very high finesse etalons. In turn, the jitter causes an effective increase in the time-averaged filter bandwidth. Radiation pressure is of little consequence in conventional Fabry-Perot etalons, but it can give rise to nonlinearities and hysteresis in the tuning response of high-finesse MEMS filters. We develop models of noise and optical nonlinearities and compare the models with a series of measurements on commercial tunable high-finesse MEMS Fabry-Perot etalons.
引用
收藏
页码:88 / 97
页数:10
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