Sequential importance sampling for nonparametric Bayes models: The next generation

被引:106
作者
MacEachern, SN [1 ]
Clyde, M [1 ]
Liu, JS [1 ]
机构
[1] Ohio State Univ, Dept Stat, Columbus, OH 43210 USA
来源
CANADIAN JOURNAL OF STATISTICS-REVUE CANADIENNE DE STATISTIQUE | 1999年 / 27卷 / 02期
关键词
beta-binomial; Dirichlet process; Gibbs sampler; importance sampling; MCMC; posterior distribution; Rao-Blackwellization; sequential imputation;
D O I
10.2307/3315637
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
There are two generations of Gibbs sampling methods for semiparametric models involving the Dirichlet process. The first generation suffered from a severe drawback: the locations of the clusters, or groups of parameters, could essentially become fixed, moving only rarely. Two strategies that have been proposed to create the second generation of Gibbs samplers are integration and appending a second stage to the Gibbs sampler wherein the cluster locations are moved. We show that these same strategies are easily implemented for the sequential importance sampler, and that the first strategy dramatically improves results. As in the case of Gibbs sampling, these strategies are applicable to a much wider class of models. They are shown to provide more uniform importance sampling weights and lead to additional Rao-Blackwellization of estimators.
引用
收藏
页码:251 / 267
页数:17
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