Atomic scale characterization of layered ternary Cr2AlC ceramic

被引：47

作者：

Lin, ZJ

Zhuo, MJ

Zhou, YC ^{[1
]}

Li, MS

Wang, JY

机构：

[1] Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China

[2] Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China

来源：

JOURNAL OF APPLIED PHYSICS | 2006年 / 99卷 / 07期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1063/1.2188074

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Cr2AlC is a recently developed layered ternary carbide. In this work, the atomic scale microstructure is reported. The layer stacking sequence of Cr and Al atoms has been clearly resolved. The atomic scale characterizations were realized by means of high resolution transmission electron microscopy and Z-contrast scanning transmission electron microscopy. Furthermore, electron energy loss spectroscopic analysis revealed that the Cr-C bonds in Cr2AlC are characterized by a strong sigma bonding. (c) 2006 American Institute of Physics.

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页数：3

相关论文

共 22 条

[1] Processing and characterization of Ti2AlC, Ti2AlN, and Ti2AlC0.5N0.5 [J].

Barsoum, MW ;

Ali, M ;

El-Raghy, T .

METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2000, 31 (07) :1857-1865

[2]

BARSOUM MW, 1996, J AM CERAM SOC, V79, P1731

[3] ATOMIC-RESOLUTION CHEMICAL-ANALYSIS USING A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].

BROWNING, ND ;

CHISHOLM, MF ;

PENNYCOOK, SJ .

NATURE, 1993, 366 (6451) :143-146

[4] Electron energy loss spectroscopy techniques for the study of microbial chromium(VI) reduction [J].

Daulton, TL ;

Little, BJ ;

Lowe, K ;

Jones-Meehan, J .

JOURNAL OF MICROBIOLOGICAL METHODS, 2002, 50 (01) :39-54

[5] Z-contrast imaging and electron energy-loss spectroscopy analysis of chromium-doped diamond-like carbon films [J].

Fan, X ;

Dickey, EC ;

Pennycook, SJ ;

Sunkara, MK .

APPLIED PHYSICS LETTERS, 1999, 75 (18) :2740-2742

[6] KOHLENSTOFFHALTIGE TERNARE VERBINDUNGEN (H-PHASE) [J].

JEITSCHKO, W ;

NOWOTNY, H ;

BENESOVSKY, F .

MONATSHEFTE FUR CHEMIE, 1963, 94 (04) :672-&

[7] Microstructural characterization of layered ternary Ti2AlC [J].

Lin, ZJ ;

Zhuo, MJ ;

Zhou, YC ;

Li, MS ;

Wang, JY .

ACTA MATERIALIA, 2006, 54 (04) :1009-1015

[8] In-situ hot pressing/solid-liquid reaction synthesis of bulk Cr2AlC [J].

Lin, ZJ ;

Zhou, YC ;

Li, MS ;

Wang, JY .

ZEITSCHRIFT FUR METALLKUNDE, 2005, 96 (03) :291-296

[9] Effect of the composition on the structure of Cr-Al-C investigated by combinatorial thin film synthesis and ab initio calculations [J].

Mertens, R ;

Sun, ZM ;

Music, D ;

Schneider, JM .

ADVANCED ENGINEERING MATERIALS, 2004, 6 (11) :903-907

[10] CHEMICALLY SENSITIVE STRUCTURE-IMAGING WITH A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].

PENNYCOOK, SJ ;

BOATNER, LA .

NATURE, 1988, 336 (6199) :565-567