PIXE characterization of CsI(Tl) scintillators used for particle detection in nuclear reactions

被引：8

作者：

Grassi, N. ^{[1
,2
]}

Casini, G. ^{[2
]}

Frosini, A. ^{[1
]}

Tobia, G. ^{[2
]}

Marchi, T. ^{[3
]}

机构：

[1] Univ Florence, Dipartimento Fis, I-50019 Florence, Italy

[2] Ist Nazl Fis Nucl, Sez Firenze, I-50019 Florence, Italy

[3] Univ Bologna, Dipartimento Fis, I-40126 Bologna, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2008年 / 266卷 / 10期

关键词：

cesium iodide scintillators; thallium doping; external PIXE;

D O I：

10.1016/j.nimb.2008.03.012

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Particle-Induced X-ray Emission has been used to measure Thallium concentration in several CsI(Tl) scintillators from different manufacturers, in order to check their nominal declared values and correlate their behaviour with actual Tl concentration. Indeed, both Tl doping level and its uniformity affect light emission of these detectors, which are largely employed in nuclear physics experiments. In some of the examined crystals Tl concentration values from PIXE measurements came out to be quite different from those declared. This allowed us to explain apparent anomalies in the trend of their alpha/gamma-induced light yield ratio versus Tl content. In some cases, the presence of unexpected contaminants was also pointed out. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：2383 / 2386

页数：4

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