XPS quantitative analysis and models of supported oxide catalysts

被引：60

作者：

Cimino, A ^{[1
]}

Gazzoli, D ^{[1
]}

Valigi, M ^{[1
]}

机构：

[1] Univ Rome La Sapienza, Dipartimento Chim, Ctr SACSO, I-00185 Rome, Italy

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1999年 / 104卷 / 1-3期

关键词：

XPS quantitative analysis; supported oxide catalysts; quantitative models for supported catalysts;

D O I：

10.1016/S0368-2048(98)00300-4

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Application of XPS to the quantitative analysis of supported oxide catalysts is reviewed. Starting from the basic quantitative equations of XPS, the development of different models is summarized, including those for flat surfaces and rough profile surfaces, as well as models treating high surface area and porous materials. The significance of the approximations used in the various models is discussed, and the different approaches are compared. Examples from the literature are reported and critically evaluated to illustrate practical examples of application. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：1 / 29

页数：29

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