Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope

被引：13

作者：

Polyakov, Boris ^{[1
,2
]}

Dorogin, Leonid M. ^{[1
]}

Vlassov, Sergei ^{[1
]}

Kink, Ilmar ^{[1
,4
]}

Romanov, Alexey E. ^{[1
,3
]}

Lohmus, Rynno ^{[1
]}

机构：

[1] Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia

[2] Univ Latvia, Inst Solid State Phys, LV-1063 Riga, Latvia

[3] RAS, Ioffe Phys Tech Inst, St Petersburg 194021, Russia

[4] Estonian Nanotechnol Competence Ctr, EE-51014 Tartu, Estonia

来源：

MICRON | 2012年 / 43卷 / 11期

关键词：

Nanotribology; Nanomanipulation; In situ electron microscopy; Zinc oxide nanowires; Static friction; Fracture strength; AFM MANIPULATION; CARBON NANOTUBES; DEVICES;

D O I：

10.1016/j.micron.2012.01.009

中图分类号：

TH742 [显微镜];

学科分类号：

080401 [精密仪器及机械];

摘要：

A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces. (C) 2012 Elsevier Ltd. All rights reserved.

引用

页码：1140 / 1146

页数：7

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