Electric-field-, temperature-, and stress-induced phase transitions in relaxor ferroelectric single crystals

被引:256
作者
Davis, M [1 ]
Damjanovic, D [1 ]
Setter, N [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Ceram Lab, Lausanne, Switzerland
关键词
D O I
10.1103/PhysRevB.73.014115
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electric-field-induced phase transitions have been evidenced by macroscopic strain measurements at temperatures between 25 degrees C and 100 degrees C in [001](C)-poled (1-x)Pb(Mg1/3Nb2/3)O-3-xPbTiO(3) [(PMN-xPT);x=0.25,0.305,0.31] and (1-x)Pb(Zn1/3Nb2/3)O-3-xPbTiO(3) [(PZN-xPT);x=0.05,0.065,0.085] single crystals. Such measurements provide a convenient way of ascertaining thermal and electrical phase stabilities over a range of compositions and give direct evidence for first-order phase transitions. A pseudorhombohedral (M-A)-pseudo-orthorhombic (M-C)-tetragonal (T) polarization rotation path is evidenced by two first-order-like, hysteretic discontinuities in strain within the same unipolar electric field cycle for PZN-5PT, PMN-30.5PT, and PMN-31PT whereas, in PMN-25PT, a single first-order-like M-A-T transition is observed. This agrees well with in situ structural studies reported elsewhere. Electric-field-temperature (E-T) phase diagrams are constructed showing general trends for M-A, M-C, and T phase stabilities for varying temperatures and electric fields in poled samples over the given range of compositions. The complex question of whether the M-A and M-C states constitute true phases, or rather piezoelectrically distorted versions of their rhombohedral (R) and orthorhombic (O) parents, is discussed. Finally, stress-induced phase transitions are evidenced in [001](C)-poled PZN-4.5PT by application of a moderate compressive stress (< 100 MPa) both along and perpendicularly to the poling direction (longitudinal and transverse modes, respectively). The rotation path is likely R-M-B-O, via a first-order, hysteretic rotation within the M-B monoclinic plane. The results are presented alongside a thorough review of previously reported electric-field-induced and stress-induced phase transitions in PMN-xPT and PZN-xPT.
引用
收藏
页数:16
相关论文
共 77 条
[11]   Field-induced polarization rotation in (001)-cut Pb(Mg1/3Nb2/3)0.76Ti0.24O3 -: art. no. 172101 [J].
Chien, RR ;
Schmidt, VH ;
Tu, CS ;
Hung, LW ;
Luo, H .
PHYSICAL REVIEW B, 2004, 69 (17) :172101-1
[12]   DIELECTRIC AND PYROELECTRIC PROPERTIES IN THE PB(MG1/3NB2/3)O3-PBTIO3 SYSTEM [J].
CHOI, SW ;
SHROUT, TR ;
JANG, SJ ;
BHALLA, AS .
FERROELECTRICS, 1989, 100 :29-38
[13]   Stress and frequency dependence of the direct piezoelectric effect in ferroelectric ceramics [J].
Damjanovic, D .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (04) :1788-1797
[14]   Correlation between dielectric anisotropy and positive or zero transverse piezoelectric coefficients in perovskite ferroelectric single crystals [J].
Davis, M ;
Damjanovic, D ;
Setter, N .
APPLIED PHYSICS LETTERS, 2005, 87 (10)
[15]   Domain engineering of the transverse piezoelectric coefficient in perovskite ferroelectrics [J].
Davis, M ;
Damjanovic, D ;
Hayem, D ;
Setter, N .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (01)
[16]  
Davis M, 2004, 2004 14th IEEE International Symposium on Applications of Ferroelectrics-ISAF-04, P102
[17]   Electric-field-induced orthorhombic to rhombohedral phase transition in [111]C-oriented 0.92Pb(Zn1/3Nb2/3)O3-0.08PbTiO3 -: art. no. 064101 [J].
Davis, M ;
Damjanovic, D ;
Setter, N .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (06)
[18]   Pyroelectric properties of (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 and (1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 single crystals measured using a dynamic method [J].
Davis, M ;
Damjanovic, D ;
Setter, N .
JOURNAL OF APPLIED PHYSICS, 2004, 96 (05) :2811-2815
[19]   Direct piezoelectric effect in relaxor-ferroelectric single crystals [J].
Davis, M ;
Damjanovic, D ;
Setter, N .
JOURNAL OF APPLIED PHYSICS, 2004, 95 (10) :5679-5684
[20]   X-ray diffraction and phenomenological studies of the engineered monoclinic crystal domains in single crystal relaxor ferroelectrics [J].
Durbin, MK ;
Hicks, JC ;
Park, SE ;
Shrout, TR .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (11) :8159-8164