Nano-imprint lithography: Templates, imprinting and wafer pattern transfer

被引:26
作者
Dauksher, W. J. [1 ]
Le, N. V. [1 ]
Ainley, E. S. [1 ]
Nordquist, K. J. [1 ]
Gehoski, K. A. [1 ]
Young, S. R. [1 ]
Baker, J. H. [1 ]
Convey, D. [1 ]
Mangat, P. S. [1 ]
机构
[1] Motorola Labs, Embedded Syst Res, Tempe, AZ 85284 USA
关键词
nano-imprint lithography; mask patterning; imprinting; template; pattern transfer;
D O I
10.1016/j.mee.2006.01.075
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nano-imprint lithography is attracting attention as a low cost method for printing nanometer-scale geometries and has obtained placement on the International Technology Roadmap for Semiconductors as a potential lithography solution at the 32 and 22 nm fabrication nodes (International Technology Roadmap for Semiconductors, 2003 ed.]. As a result, nano-imprint technology and infrastructure development related to template infrastructure, imprinting capabilities, and wafer-level pattern transfer processes are essential to successfully make the transition from research and development to a viable manufacturing processing technique suitable for multiple applications. Motorola Labs has been focusing on developing the template and wafer-level processes while optimizing the imprinting process and collaborating with external partners to optimize both the inspection and repair of imprint templates. This paper reviews recent results of the above-mentioned focus areas. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:929 / 932
页数:4
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