Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters

被引：2

作者：

Enpuku, K ^{[1
]}

Minotani, T ^{[1
]}

Shiraishi, F ^{[1
]}

Kandori, A ^{[1
]}

机构：

[1] Kyushu Univ, Dept Elect Device Engn, Fukuoka 8128581, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1999年 / 38卷 / 4B期

关键词：

bicrystal junction; 1/f noise; critical current fluctuation; SQUID; high T-c superconductor;

D O I：

10.1143/JJAP.38.L433

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current I, and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross [Appl. Phys. Lett. 70, 120 (1997)] and the relationship between I, and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between I, and R.

引用

页码：L433 / L435

页数：3

共 13 条

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