partial derivativen/partial derivativeT measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters

被引：19

作者：

Drouard, E ^{[1
]}

Huguet-Chantôme, P ^{[1
]}

Escoubas, L ^{[1
]}

Flory, F ^{[1
]}

机构：

[1] Ecole Natl Super Phys Marseille, Inst Fresnel, Unite Mixte Rech 6133, CNRS, F-13397 Marseille 20, France

来源：

APPLIED OPTICS | 2002年 / 41卷 / 16期

关键词：

D O I：

10.1364/AO.41.003132

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Measurements of partial derivativen/partial derivativeT of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed. (C) 2002 Optical Society of America.

引用

页码：3132 / 3136

页数：5

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