m-lines technique:: prism coupling measurement and discussion of accuracy for homogeneous waveguides

被引:82
作者
Monneret, S [1 ]
Huguet-Chantôme, P [1 ]
Flory, F [1 ]
机构
[1] Ecole Natl Super Phys Marseille, Lab Opt Surfaces & Couches Minces, F-13397 Marseille 20, France
来源
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS | 2000年 / 2卷 / 03期
关键词
thin films; m-lines; prism coupling; optical waveguides; refractive index;
D O I
10.1088/1464-4258/2/3/304
中图分类号
O43 [光学];
学科分类号
070207 [光学]; 0803 [光学工程];
摘要
A method is proposed to measure the thickness of the air layer between the prism and the waveguide in a totally reflecting prism coupler. The coupling efficiency of a Gaussian beam from the prism into the waveguide can be calculated when the air-layer thickness (ALT) is known. To perform measurements of the indices and thicknesses of planar waveguides using the m-lines technique, it is necessary to have a good knowledge of the prism's characteristics and to accurately measure the angles. However, we show by means of an example that the small distance between the prism and the guide (i.e. the ALT) should be taken into account in order to achieve accurate measurements.
引用
收藏
页码:188 / 195
页数:8
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