Variable-temperature electrical measurements of zinc oxide/tin oxide-cosubstituted indium oxide

被引:55
作者
Ambrosini, A
Palmer, GB
Maignan, A
Poeppelmeier, KR
Lane, MA
Brazis, P
Kannewurf, CR
Hogan, T
Mason, TO
机构
[1] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA
[2] Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA
[3] Michigan State Univ, E Lansing, MI 48824 USA
[4] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[5] ISMRA Univ Caen, CNRS, UMR 6508, Lab CRISMAT, F-14050 Caen, France
关键词
D O I
10.1021/cm0100725
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The electrical conductivity, Hall effect, and thermoelectric coefficient of Zn/Sn-cosubstituted In2O3 (In2-2xSnxZnxO3-delta), undoped In2O3, and indium-tin oxide (ITO) were studied vs cation composition, state of reduction, and measurement temperature (over the range of 4.2-340 K). Carrier contents and mobilities were determined from the Hall coefficient and conductivity in each case. In2-2xSnxZnxO3-delta displays conductivities up to 1 order of magnitude lower than ITO, and the conductivity of the material decreases with increasing cosubstitution, from approximately 860 to 235 S/cm. Reduction of the materials under flowing H-2/N-2 increases their carrier concentrations and therefore their conductivities. These results are discussed in terms of possible defect and transport models.
引用
收藏
页码:52 / 57
页数:6
相关论文
共 20 条
[1]   APPARATUS FOR THERMOPOWER MEASUREMENTS ON ORGANIC CONDUCTORS [J].
CHAIKIN, PM ;
KWAK, JF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (02) :218-220
[2]   ELECTRICAL PROPERTIES OF IN2O3 [J].
DEWIT, JHW .
JOURNAL OF SOLID STATE CHEMISTRY, 1973, 8 (02) :142-149
[3]   ELECTRICAL-PROPERTIES AND DEFECT MODEL OF TIN-DOPED INDIUM OXIDE LAYERS [J].
FRANK, G ;
KOSTLIN, H .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 27 (04) :197-206
[4]   Neutron diffraction study on the defect structure of indium-tin-oxide [J].
González, GB ;
Cohen, JB ;
Hwang, JH ;
Mason, TO ;
Hodges, JP ;
Jorgensen, JD .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (05) :2550-2555
[5]   EVAPORATED SN-DOPED IN2O3 FILMS - BASIC OPTICAL-PROPERTIES AND APPLICATIONS TO ENERGY-EFFICIENT WINDOWS [J].
HAMBERG, I ;
GRANQVIST, CG .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (11) :R123-R159
[6]   Point defects and electrical properties of Sn-doped In-based transparent conducting oxides [J].
Hwang, JH ;
Edwards, DD ;
Kammler, DR ;
Mason, TO .
SOLID STATE IONICS, 2000, 129 (1-4) :135-144
[7]   COMPUTER AUTOMATED CHARGE TRANSPORT MEASUREMENT SYSTEM [J].
LYDING, JW ;
MARCY, HO ;
MARKS, TJ ;
KANNEWURF, CR .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1988, 37 (01) :76-80
[8]  
LYNAM NR, 1990, S EL MAT EL SOC, V90, P201
[9]   COMPUTER CONTROL OF A SLOW-AC TECHNIQUE FOR THERMOPOWER MEASUREMENTS [J].
MARCY, HO ;
MARKS, TJ ;
KANNEWURF, CR .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (05) :756-760
[10]   REFINEMENT OF CRYSTAL STRUCTURE OF IN2O3 AT 2 WAVELENGTHS [J].
MAREZIO, M .
ACTA CRYSTALLOGRAPHICA, 1966, 20 :723-&