Resolution of discrepancies of atomic form factors and attenuation coefficients in the near-edge soft X-ray regime

被引：9

作者：

Chantler, CT ^{[1
]}

机构：

[1] Univ Melbourne, Sch Phys, Parkville, Vic 3052, Australia

来源：

RADIATION PHYSICS AND CHEMISTRY | 1999年 / 55卷 / 03期

关键词：

D O I：

10.1016/S0969-806X(98)00345-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-rays interactions with atoms should be well understood quantitatively. Reliable knowledge of the complex X-ray form factor (Re(f) and f ") and the photoelectric attenuation coefficient sigma(PE) is required for crystallography, medical diagnosis, radiation safety and XAFS studies. Discrepancies between currently used theoretical approaches of 200% exist for numerous elements from 1 to 3 keV X-ray energies. This paper addresses key discrepancies and derives new theoretical results in near-edge soft X-ray regions of recent interest. (C) 1999 Elsevier Science Ltd. All rights reserved.

引用

页码：231 / 237

页数：7

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