Full counting statistics for a single-electron transistor:: Nonequilibrium effects at intermediate conductance

被引:40
作者
Utsumi, Y
Golubev, DS
Schön, G
机构
[1] Univ Karlsruhe, Inst Theoret Festkoperphys, D-76128 Karlsruhe, Germany
[2] RIKEN, Condensed Matter Theory Lab, Wako, Saitama 3510198, Japan
[3] PN Lebedev Phys Inst, IE Tamm Dept Theoret Phys, Moscow 119991, Russia
[4] Forschungszentrum Karlsruhe, Inst Nanotechnol, D-76021 Karlsruhe, Germany
关键词
D O I
10.1103/PhysRevLett.96.086803
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We evaluate the current distribution for a single-electron transistor with intermediate strength tunnel conductance. Using the Schwinger-Keldysh approach and the drone (Majorana) fermion representation, we account for the renormalization of system parameters. Nonequilibrium effects induce a lifetime broadening of the charge-state levels, which suppress large current fluctuations.
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