Optical properties of the epitaxial Pb1-xLaxTiO3 thin films grown by metalorganic chemical vapor deposition

被引：12

作者：

Kim, Y ^{[1
]}

Erbil, A ^{[1
]}

机构：

[1] GEORGIA INST TECHNOL,SCH PHYS,ATLANTA,GA 30332

来源：

APPLIED PHYSICS LETTERS | 1997年 / 70卷 / 02期

关键词：

D O I：

10.1063/1.118340

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The dispersion of the refractive indices for the epitaxial Pb1-xLaxTiO3 thin films with x=0.28 and 0.23 grown on the MgO (100) and Al2O3 (0001) substrates, respectively, has been investigated. The refractive indices in the wavelength range of 435-1523 nm were measured by a prism coupling method. At a wavelength range of 632.8 nm, the refractive index of a PLT film grown with (100) orientation was determined to be 2.609. The transmission spectrum was used as an additional measurement for the dispersion of the refractive index and showed a good agreement with the prism coupling measurements. The dispersion of refractive index fits well to a single-term Sellmeier relation. (C) 1997 American Institute of Physics.

引用

页码：143 / 145

页数：3

共 8 条

[1] FERROELECTRIC (PB,LA)(ZR,TI)O3 EPITAXIAL THIN-FILMS ON SAPPHIRE GROWN BY RF-PLANAR MAGNETRON SPUTTERING [J].