Epitaxy of (106)-oriented SrBi2Ta2O9 and SrBi2Nb2O9 thin films

被引：19

作者：

Nagahama, T

Manabe, T

Yamaguchi, I

Kumagai, T

Tsuchiya, T

Mizuta, S

机构：

[1] Sci Univ Tokyo, Dept Mat Sci & Technol, Noda, Chiba 2780022, Japan

[2] Natl Inst Mat & Chem Res, Tsukuba, Ibaraki 3058565, Japan

来源：

THIN SOLID FILMS | 1999年 / 353卷 / 1-2期

关键词：

bismuth layer-structured ferroelectrics; coating-pyrolysis process; epitaxy; pole-figure analysis; reciprocal-space map;

D O I：

10.1016/S0040-6090(99)00372-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Non-c-axis oriented epitaxial films of bismuth layer-structured ferroelectrics, SrBi2Ta2O9 (SBT) and SrBi2Nb2O9 (SBN), were prepared on SrTiO3(110) by coating-pyrolysis process. These films were found to be (106)-oriented (pseudo-tetragonal indices). interestingly, this orientation is 'stealthy' or unseen in the conventional XRD theta-2 theta scans due to extinction rule so that its presence was revealed by XRD pole-figure measurement and reciprocal-space mapping. The crystallographic relationship of the films and substrates was SBT, SBN (106) parallel to SrTiO3 (110) and SBT, SBN [010] parallel to SrTiO3 [001]. This epitaxial relationship was also discussed from the standpoint of ion arrangement. (C) 1999 Elsevier Science S.A. All rights reserved.

引用

页码：52 / 55

页数：4

共 9 条

[1]

AURIVILLIUS B, 1949, ARK KEMI, V0001

[2] Control of epitaxial growth for SrBi2Ta2O9 thin films [J].